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Diamond micro-Raman thermometers for accurate gate temperature measurements (2014)

First Author: Simon R

Attributed to: Novel Sub-Threshold Methodologies for GaN Electronic Devices: A Study of Device Reliability and Degradation Mechanisms funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4879849

Publication URI: http://dx.doi.org/10.1063/1.4879849

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 21