Diamond micro-Raman thermometers for accurate gate temperature measurements (2014)
Attributed to:
Novel Sub-Threshold Methodologies for GaN Electronic Devices: A Study of Device Reliability and Degradation Mechanisms
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4879849
Publication URI: http://dx.doi.org/10.1063/1.4879849
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 21