Reliability of AlGaN/GaN high electron mobility transistors on low dislocation density bulk GaN substrate: Implications of surface step edges (2013)
Attributed to:
Novel Thermal Management of Power Electronic Devices: High Power High Frequency Planar Gunn Diodes
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4829062
Publication URI: http://dx.doi.org/10.1063/1.4829062
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 19