📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

Contactless Thermal Boundary Resistance Measurement of GaN-on-Diamond Wafers (2014)

First Author: Pomeroy J

Attributed to: Novel High Thermal Conductivity Substrates for GaN Electronics: Thermal Innovation funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2014.2350075

Publication URI: http://dx.doi.org/10.1109/led.2014.2350075

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 10