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Liquid crystal electrography: Electric field mapping and detection of peak electric field strength in AlGaN/GaN high electron mobility transistors (2014)

First Author: Möreke J

Attributed to: Development of an integrated optical E-Probe for GaN power transistor reliability analysis funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2014.01.006

Publication URI: http://dx.doi.org/10.1016/j.microrel.2014.01.006

Type: Journal Article/Review

Parent Publication: Microelectronics Reliability

Issue: 5