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Impact of PVT variation on delay test of resistive open and resistive bridge defects (2013)

First Author: Zhong S

Attributed to: Variation-Aware Test for NanoScale CMOS Integrated Circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/dft.2013.6653611

Publication URI: http://dx.doi.org/10.1109/dft.2013.6653611

Type: Conference/Paper/Proceeding/Abstract