Impact of PVT variation on delay test of resistive open and resistive bridge defects (2013)
Attributed to:
Resilient and Testable Energy-Efficient Digital Hardware
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/dft.2013.6653611
Publication URI: http://dx.doi.org/10.1109/dft.2013.6653611
Type: Conference/Paper/Proceeding/Abstract