Impact of PVT variation on delay test of resistive open and resistive bridge defects (2013)

First Author: Zhong S
Attributed to:  Variation-Aware Test for NanoScale CMOS Integrated Circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/dft.2013.6653611

Publication URI: http://dx.doi.org/10.1109/dft.2013.6653611

Type: Conference/Paper/Proceeding/Abstract