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Cost-Effective TSV Grouping for Yield Improvement of 3D-ICs (2011)

First Author: Zhao Y

Attributed to: Variation-Aware Test for NanoScale CMOS Integrated Circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ats.2011.37

Publication URI: http://dx.doi.org/10.1109/ats.2011.37

Type: Conference/Paper/Proceeding/Abstract

ISBN: 978-1-4577-1984-4