Improved DFT for Testing Power Switches (2011)

First Author: Khursheed S
Attributed to:  Variation-Aware Test for NanoScale CMOS Integrated Circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ets.2011.63

Publication URI: http://dx.doi.org/10.1109/ets.2011.63

Type: Conference/Paper/Proceeding/Abstract

ISBN: 978-1-4577-0483-3