Morphological, structural, and emission characterization of trench defects in InGaN/GaN quantum well structures (2012)
Attributed to:
Lighting the Future
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4768291
Publication URI: http://dx.doi.org/10.1063/1.4768291
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 21