Atom probe tomography assessment of the impact of electron beam exposure on InxGa1-xN/GaN quantum wells (2011)
Attributed to:
Materials Challenges in GaN-based Light Emitting Structures
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.3610468
Publication URI: http://dx.doi.org/10.1063/1.3610468
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 2