Mg dopant distribution in an AlGaN/GaN p-type superlattice assessed using atom probe tomography, TEM and SIMS (2010)
Attributed to:
Nitrides for the 21st century
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1742-6596/209/1/012014
Publication URI: http://dx.doi.org/10.1088/1742-6596/209/1/012014
Type: Journal Article/Review
Parent Publication: Journal of Physics: Conference Series