Atom Probe Tomography Studies of GaN-Based Semiconductor Materials (2009)
Attributed to:
Science Bridge Award USA: Harnessing Materials for Energy
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1017/s1431927609097979
Publication URI: http://dx.doi.org/10.1017/s1431927609097979
Type: Journal Article/Review
Parent Publication: Microscopy and Microanalysis
Issue: S2