Atom Probe Tomography Studies of GaN-Based Semiconductor Materials (2009)

First Author: Bennett S

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/S1431927609097979

Publication URI: http://dx.doi.org/10.1017/S1431927609097979

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: S2