The Puzzle of Exciton Localisation in GaN-Based Structures: TEM, AFM and 3D APFIM Hold the Key

First Author: Humphreys C

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/978-1-4020-8615-1_1

Publication URI: http://dx.doi.org/10.1007/978-1-4020-8615-1_1

Type: Book Chapter

Book Title: Microscopy of Semiconducting Materials 2007 (2008)

Page Reference: 3-12

ISBN: 978-1-4020-8614-4