Use of energy-filtered photoelectron emission microscopy and Kelvin probe force microscopy to visualise work function changes on diamond thin films terminated with oxygen and lithium mono-layers for thermionic energy conversion (2014)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1504/ijnt.2014.063789

Publication URI: http://dx.doi.org/10.1504/ijnt.2014.063789

Type: Journal Article/Review

Parent Publication: International Journal of Nanotechnology

Issue: 9/10/11