Measuring Code Optimization Impact on Voltage Noise (2013)

First Author: Kanev S
Attributed to:  DOME: Delaying and Overcoming Microprocessor Errors funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: http://www.cl.cam.ac.uk/~tmj32/papers/docs/kanev13-selse.pdf

Type: Conference/Paper/Proceeding/Abstract

Volume: None

Parent Publication: Workshop on Silicon Errors in Logic - System Effects (SELSE)