Advances in AFM for the electrical characterization of semiconductors (2008)

First Author: Oliver R

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0034-4885/71/7/076501

Publication URI: http://dx.doi.org/10.1088/0034-4885/71/7/076501

Type: Journal Article/Review

Parent Publication: Reports on Progress in Physics

Issue: 7