Scanning capacitance microscopy as a tool for the assessment of unintentional doping in GaN (2009)

First Author: Oliver R
Attributed to:  Materials Challenges in GaN-based Light Emitting Structures funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/pssc.200880824

Publication URI: http://dx.doi.org/10.1002/pssc.200880824

Type: Journal Article/Review

Parent Publication: physica status solidi c

Issue: S2