High resolution transmission electron microscopy and three-dimensional atom probe microscopy as complementary techniques for the high spatial resolution analysis of GaN based quantum well systems (2013)
Attributed to:
Lighting the Future
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1179/174328408x270301
Publication URI: http://dx.doi.org/10.1179/174328408x270301
Type: Journal Article/Review
Parent Publication: Materials Science and Technology
Issue: 6