Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films. (2012)
Attributed to:
Active Plasmonics: Electronic and All-optical Control of Photonic Signals on Sub-wavelength Scales
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/oe.20.004419
PubMed Identifier: 22418201
Publication URI: http://europepmc.org/abstract/MED/22418201
Type: Journal Article/Review
Volume: 20
Parent Publication: Optics express
Issue: 4
ISSN: 1094-4087