Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films. (2012)

First Author: Lei DY

Attributed to: New Tools for Nanometrology funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/oe.20.004419

PubMed Identifier: 22418201

Publication URI: http://europepmc.org/abstract/MED/22418201

Type: Journal Article/Review

Volume: 20

Parent Publication: Optics express

Issue: 4

ISSN: 1094-4087