Identification and Classification of Infrared Excess Sources in the Spitzer Enhanced Imaging Products (SEIP) Catalog (2015)
Attributed to:
A Programme of Technology, Astrophysics and Cosmology in Cardiff 2012-14
funded by
STFC
Abstract
No abstract provided
Bibliographic Information
Type: Working Paper
Volume: 225
Parent Publication: American Astronomical Society Meeting Abstracts #225