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Scanning transmission electron microscopy investigation of the Si(111)/AlN interface grown by metalorganic vapor phase epitaxy (2010)

First Author: Radtke G

Attributed to: Nitrides for the 21st century funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.3527928

Publication URI: http://dx.doi.org/10.1063/1.3527928

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 25