Analysis of Defect-Related Localized Emission Processes in InGaN/GaN-Based LEDs (2012)
Attributed to:
Lighting the Future
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ted.2012.2186970
Publication URI: http://dx.doi.org/10.1109/ted.2012.2186970
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Electron Devices
Issue: 5