Analysis of Defect-Related Localized Emission Processes in InGaN/GaN-Based LEDs (2012)

First Author: Meneghini M

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/TED.2012.2186970

Publication URI: http://dx.doi.org/10.1109/TED.2012.2186970

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 5