Analysis of thin impurity doped layers in anodic alumina and anodic tantala films by glow discharge time-of-flight mass spectrometry (2013)
Attributed to:
LIGHT ALLOYS TOWARDS ENVIRONMETALLY SUSTAINABLE TRANSPORT: 2nd GENERATION SOLUTIONS FOR ADVANCED METALLIC SYSTEMS (LATEST2)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1179/174591910x12692576434617
Publication URI: http://dx.doi.org/10.1179/174591910x12692576434617
Type: Journal Article/Review
Parent Publication: Transactions of the IMF
Issue: 3