Measuring dislocation densities in nonpolar a-plane GaN films using atomic force microscopy (2010)
Attributed to:
LED Lighting for the 21st Century
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/0022-3727/43/5/055303
Publication URI: http://dx.doi.org/10.1088/0022-3727/43/5/055303
Type: Journal Article/Review
Parent Publication: Journal of Physics D: Applied Physics
Issue: 5