📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Morphological changes of InGaN epilayers during annealing assessed by spectral analysis of atomic force microscopy images (2009)

First Author: Oliver R

Attributed to: Science Bridge Award USA: Harnessing Materials for Energy funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.3212971

Publication URI: http://dx.doi.org/10.1063/1.3212971

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 5