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Morphological changes of InGaN epilayers during annealing assessed by spectral analysis of atomic force microscopy images (2009)

First Author: Oliver R

Attributed to: Nitrides for the 21st century funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.3212971

Publication URI: http://dx.doi.org/10.1063/1.3212971

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 5