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Characterization of defects in Mg doped GaN epitaxial layers using conductance measurements (2012)

First Author: Elsherif O

Attributed to: Lighting the Future funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.tsf.2011.11.020

Publication URI: http://dx.doi.org/10.1016/j.tsf.2011.11.020

Type: Journal Article/Review

Parent Publication: Thin Solid Films

Issue: 7