Characterization of defects in Mg doped GaN epitaxial layers using conductance measurements (2012)
Attributed to:
Science Bridge Award USA: Harnessing Materials for Energy
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.tsf.2011.11.020
Publication URI: http://dx.doi.org/10.1016/j.tsf.2011.11.020
Type: Journal Article/Review
Parent Publication: Thin Solid Films
Issue: 7