Fundamentals of X-ray Diffraction Characterisation of Strain in GaN Based Compounds (2013)

First Author: Oehler F

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.7567/JJAP.52.08JB29

Publication URI: http://dx.doi.org/10.7567/JJAP.52.08JB29

Type: Journal Article/Review

Parent Publication: Japanese Journal of Applied Physics

Issue: 8S