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Determination of the composition and thickness of semi-polar and non-polar III-nitride films and quantum wells using X-ray scattering (2012)

First Author: Vickers M

Attributed to: Nitrides for the 21st century funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.3678631

Publication URI: http://dx.doi.org/10.1063/1.3678631

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 4