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Measurement of the Al content in AlGaN epitaxial layers by combined energy-dispersive X-ray and electron energy-loss spectroscopy in a transmission electron microscope (2012)

First Author: Amari H

Attributed to: Lighting the Future funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/pssc.201100165

Publication URI: http://dx.doi.org/10.1002/pssc.201100165

Type: Journal Article/Review

Parent Publication: physica status solidi c

Issue: 3-4