The effects of Si doping on dislocation movement and tensile stress in GaN films (2011)
Attributed to:
Science Bridge Award USA: Harnessing Materials for Energy
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.3553841
Publication URI: http://dx.doi.org/10.1063/1.3553841
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 7