📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

Accurate calibration for the quantification of the Al content in AlGaN epitaxial layers by energy-dispersive X-ray spectroscopy in a Transmission Electron Microscope (2011)

First Author: Amari H

Attributed to: Lighting the Future funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1742-6596/326/1/012028

Publication URI: http://dx.doi.org/10.1088/1742-6596/326/1/012028

Type: Journal Article/Review

Parent Publication: Journal of Physics: Conference Series