Dislocation movement in GaN films (2010)

First Author: Moram M

Attributed to: Quantitative, high resolution two-and-three dimensional dopant mapping in the Scanning Electron Microscope by Secondary Electron Spectro-Micro funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.3532965

Publication URI: http://dx.doi.org/10.1063/1.3532965

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 26