Site-selective dopant profiling of p-n junction specimens in the dual-beam FIB/SEM system (2010)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1742-6596/209/1/012069

Publication URI: http://dx.doi.org/10.1088/1742-6596/209/1/012069

Type: Journal Article/Review

Parent Publication: Journal of Physics: Conference Series