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Approaches to modelling irradiation-induced processes in transmission electron microscopy. (2013)

First Author: Skowron ST

Attributed to: New nanodevices for force/mass measurements and data storage: design and characterisation funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1039/c3nr02130k

PubMed Identifier: 23783785

Publication URI: http://europepmc.org/abstract/MED/23783785

Type: Journal Article/Review

Volume: 5

Parent Publication: Nanoscale

Issue: 15

ISSN: 2040-3364