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Coincident Electron Channeling and Cathodoluminescence Studies of Threading Dislocations in GaN (2013)

First Author: Naresh-Kumar G

Attributed to: Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC. funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927613013755

PubMed Identifier: 24230966

Publication URI: http://europepmc.org/abstract/MED/24230966

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: 1

ISSN: 1431-9276