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Cathodoluminescence Hyperspectral Imaging of Nitride Semiconductors: Introducing New Variables (2014)

First Author: Edwards P

Attributed to: Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC. funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927614006254

Publication URI: http://dx.doi.org/10.1017/s1431927614006254

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: S3