Impact of N2O passivation on 4H-SiC/SiO2 interfaces grown at high-temperature",
Attributed to:
Transformation of the Top and Tail of Energy Networks
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Type: Conference/Paper/Proceeding/Abstract
Parent Publication: ECSCRM 2014, Grenoble-France, 21-25 Sept. 2014.