📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

Impact of N2O passivation on 4H-SiC/SiO2 interfaces grown at high-temperature",

First Author: Sharma Y

Attributed to: Transformation of the Top and Tail of Energy Networks funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Type: Conference/Paper/Proceeding/Abstract

Parent Publication: ECSCRM 2014, Grenoble-France, 21-25 Sept. 2014.