Detection of heterogeneities in single-crystal CaCu 3 Ti 4 O 12 using conductive atomic force microscopy (2010)
Attributed to:
New and Improved Electroceramics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1757-899x/8/1/012018
Publication URI: http://dx.doi.org/10.1088/1757-899x/8/1/012018
Type: Journal Article/Review
Parent Publication: IOP Conference Series: Materials Science and Engineering