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A Non-raster Scanning Approach in Atomic Force Microscopy Using a Combined Contour Prediction Algorithm (2014)

First Author: Zhang K

Attributed to: Robustness and adaptivity: advanced control and estimation algorithms for the transverse dynamic atomic force microscope funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3182/20140824-6-za-1003.01683

Publication URI: http://dx.doi.org/10.3182/20140824-6-za-1003.01683

Type: Journal Article/Review

Parent Publication: IFAC Proceedings Volumes

Issue: 3