Dual wavelength optical metrology using ptychography (2013)
Attributed to:
Ultimate Microsocopy: Wavelength-Limited Resolution Without High Quality Lenses
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/2040-8978/15/3/035702
Publication URI: http://dx.doi.org/10.1088/2040-8978/15/3/035702
Type: Journal Article/Review
Parent Publication: Journal of Optics
Issue: 3