Ptychography applied to optical metrology (2012)
Attributed to:
Ultimate Microsocopy: Wavelength-Limited Resolution Without High Quality Lenses
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1117/12.977959
Publication URI: http://dx.doi.org/10.1117/12.977959
Type: Conference/Paper/Proceeding/Abstract