Real-time surface defect detection and the traceable measurement of defect depth in 3D (2013)

First Author: Tailor, M
Attributed to:  EPSRC Centre for Innovative Manufacturing in Intelligent Automation funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: http://www.euspen.eu/Portals/0/Content/2000-2013/Resources/Proceedings/Lamdamap%20Proceedings%202013.pdf

Type: Conference/Paper/Proceeding/Abstract

Parent Publication: Proceedings of LAMDAMAP 2013