Thermal Conductivity Measurement Methods for SiGe Thermoelectric Materials (2013)
Attributed to:
Scanning thermal conduction microscopy with dual cantilever resistive probe
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1007/s11664-013-2505-3
Publication URI: http://dx.doi.org/10.1007/s11664-013-2505-3
Type: Journal Article/Review
Parent Publication: Journal of Electronic Materials
Issue: 7