Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride Thin Films (2008)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1017/s1431927608086856
Publication URI: http://dx.doi.org/10.1017/s1431927608086856
Type: Journal Article/Review
Parent Publication: Microscopy and Microanalysis
Issue: S2